0% and 16.2%, respectively). Therefore, the reflectance is obviously reduced by the nanoflake In2S3 and decreased as the GNS-1480 datasheet thickness of In2S3 film increases. It could be attributed to the decreasing reflectance for In2S3 film

at short wavelengths because the nanotexturization was on the surface [21]. Figure 5 Reflectance spectra of the planar p-Si, textured p-Si, and the In 2 S 3 film with various thicknesses on textured p-Si substrate. Figure 6a displays the schematic structure of the heterojunction solar cell in which the nanotextured In2S3/p-Si was the photoactive layer of such a device. Photovoltaic performance of the AZO/In2S3/p-Si heterojunction solar cell with various In2S3 thicknesses is given in Table 1. All samples for the electrical measurement were performed with Selleckchem PKC412 AZO film of about 400 nm. Characterization of the AZO/In2S3 film deposited on the textured p-Si substrate was studied for the first time. Figure 6b shows a SEM image of an inclined angle of the AZO/In2S3/p-Si heterojunction structure. The AZO deposited on the In2S3 (100 nm)/p-Si substrate exhibits a well coverage and turns into a cylinder-like structure with a hemispherical top as shown in the inset of Figure 6b. The deposition thickness of the AZO was estimated to be 400 nm. Jiang et al. [22] revealed that they had fabricated the SnS/α-Si heterojunction photovoltaic devices, which the junction exhibited a typical rectified

diode behavior, and the short-circuit Avelestat (AZD9668) Nutlin-3a in vivo current density was 1.55 mA/cm2. Hence, the AZO/In2S3/p-Si structure in the study was suitable for solar cell application. Figure 6 Structure, SEM image, J – V characteristics, and J sc and FF of the heterojunction solar cells. (a) Schematic structure of In2S3/textured p-Si heterojunction solar cell, (b) SEM image of AZO/In2S3/textured p-Si, (c) J-V characteristics, and (d) the Jsc and fill factor (F.F.) of the In2S3/p-Si heterojunction solar cell with various thicknesses of In2S3. Table 1 Photovoltaic performance of the AZO/In 2 S 3 /p-Si heterojunction solar cell with various thicknesses of In 2 S 3 Device V oc J sc(mA/cm2) F.F. (%)

Efficiency (%) Non-In2S3 0.20 10.68 21.95 0.47 In2S3 (50 nm) 0.28 21.18 30.55 1.81 In2S3 (100 nm) 0.32 23.43 31.82 2.39 In2S3 (200 nm) 0.24 16.37 32.14 1.26 In2S3 (300 nm) 0.24 16.08 28.10 1.08 The photovoltaic condition is AM 1.5 G at 100-mW/cm2 illumination. The current–voltage (J-V) characteristics of the fabricated photovoltaic devices were measured under an illumination intensity of 100 mW/cm2, as shown in Figure 6c. Such result shows that the short-circuit currents (Jsc) were increased while the In2S3 films were deposited onto the p-Si. The power conversion efficiency (PCE) of the devices can be obviously improved from 0.47% to 2.39% by employing a 100-nm-thick In2S3 film. It was also found that the highest open-circuit voltage (Voc) and short-circuit current density are 0.32 V and 23.4 mA/cm2, respectively.